FISCHERSCOPE® X-RAY XDV®-µ Tutorials

FISCHERSCOPE® X-RAY XDV®-µ Tutorials

Grace Chua, a Marketing Specialist at Helmut Fischer, demonstrates how user-friendly it is to use the FISCHERSCOPE® X-RAY XDV®-µ through a series of tutorials. The XDV®-µ is a X-Ray Fluorescence Measuring Instrument with a Polycapillary X-Ray Optics for Measurements on Very Small Components and Structures. All devices are equipped with polycapillary optics that focus the X-ray beam, making measuring spots (fwhm) with diameters between 10 and 60 μm possible. The high intensity of the focused radiation results in a short measuring duration. Besides the universally applicable XDV-μ, specialized devices are also available for the electronics and semiconductor industries. For example, the XDV-μ LD is optimized for measuring on printed circuit boards, while the XDV-μ Wafer is intended for use in clean rooms.

Tutorial part 1: Introduction

Tutorial part 2: Test of Stability, Calibration and Normalization

Tutorial part 3: XY Programming

Grace Chua

Grace Chua is a Marketing Specialist at Helmut Fischer based in Singapore. She contributes to maintaining the company blog, product tutorial videos and regional marketing activities.

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